Course Manual KAT1
Image Sensor Technology
PDF Course Catalog Deutsche Version: KAT1
Version: 3 | Last Change: 29.09.2019 13:46 | Draft: 0 | Status: vom verantwortlichen Dozent freigegeben
| Long name | Image Sensor Technology |
|---|---|
| Approving CModule | KAT1_BaMT |
| Responsible |
Prof. Dr.-Ing. Dirk Poggemann
Professor Fakultät IME |
| Valid from | summer semester 2022 |
| Level | Bachelor |
| Semester in the year | summer semester |
| Duration | Semester |
| Hours in self-study | 60 |
| ECTS | 5 |
| Professors |
Prof. Dr.-Ing. Dirk Poggemann
Professor Fakultät IME |
| Requirements | Basic Knowledge in Electronics (Module "Electronics") and Optics and Sensors (Modules "Phototechnology 1", "Phototechnology 2" and "Phototechnology 3") |
| Language | German, English if necessary |
| Separate final exam | Yes |
Literature
| G. C. Holst, T. S. Lomheim, CMOS/CCD Sensors and Camera Systems, SPIE |
| G. R. Hopkinson, T. M. Goodman, S. R. Prince, A Guide to the Use and Calibration of Detector Array Equipment, SPIE |
| J.R.Janesick, Photon Transfer DN -> Lambda, SPIE |
Final exam
| Details | Written exam with arithmetic and comprehension excercises |
|---|---|
| Minimum standard | 50% of maximum points |
| Exam Type | EN Klausur |
Learning goals
| Goal type | Description |
|---|---|
| Knowledge | Electronic Characteristics of Image Sensors - Pixelfunction (Semiconductors / Photoelectric Effect, Photo-/Darkcurrent, Electrontransfer, Charge-/Voltage Conversion) - CCD-Function (Chargetransfer, Binning, Multiple Output, CCD-Architectures) - CMOS-Function (Read-Out, Exposurecontrol / Rolling Shutter, HDR-Sensors, Live-View) - Comparison CCD-CMOS - Modelling and Measurement of Electronic Characteristics (Linearization, Offset and Gain, Defectpixel, Determined Signalartifacts (FPN, DSNU, PRNU), Random Signalartifacts (real Noise), Influence of Temperature) Optical Charateristics of Image Sensors - Optical Stack (Antialiasing-Filter, Microlenses, IR-Filter, Color-Filter, Semiconductor-Topography) - Modelling and Measurement of Optical Characteristics (Pixel-MTF, Vignetting, Spectral Sensitivity) Image Correction - Linearization/Gain- and Offset-Correction, Dark Image Subtraction (DSNU) Flatfielding (PRNU, Vignetting) - Multiple-Output-Correction Defectpixel- and Defectcluster-Correction |
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Lecture | 3 |
| Tutorial (voluntary) | 0 |
Special requirements
| none |
| Accompanying material |
electronic slides as presented during lectures electronic collection of excercises |
|---|---|
| Separate exam | No |
Learning goals
| Goal type | Description |
|---|---|
| Skills | Measurement and Simulation of Characteristic Curve (Photodiode) Measurement of Electronic Characteristics of Image Sensors Measurement of Optical Characteristics of Image Sensors Description and Documentation of Results |
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Practical training | 2 |
| Tutorial (voluntary) | 0 |
Special requirements
| none |
| Accompanying material | electronic description of lab-excercises |
|---|---|
| Separate exam | Yes |
Separate exam
| Exam Type | EN praxisnahes Szenario bearbeiten (z.B. im Praktikum) |
|---|---|
| Details | short technical discussion during lab excercise Reports about lab excercises |
| Minimum standard | Reports for all lab excercises must be delivered in correct form with correct results |
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