Course Manual LMK
Light microscopy
PDF Course Catalog Deutsche Version: LMK
Version: 1 | Last Change: 19.09.2019 15:08 | Draft: 0 | Status: vom verantwortlichen Dozent freigegeben
| Long name | Light microscopy |
|---|---|
| Approving CModule | LMK_BaET, LMK_BaET |
| Responsible |
Prof. Dr. Stefan Altmeyer
Professor Fakultät IME |
| Valid from | winter semester 2022/23 |
| Level | Bachelor |
| Semester in the year | winter semester |
| Duration | Semester |
| Hours in self-study | 78 |
| ECTS | 5 |
| Professors |
Prof. Dr. Stefan Altmeyer
Professor Fakultät IME |
| Requirements | mathematics; vector calculus complex numbers physics / optics: geometrical optics wave optics |
| Language | German |
| Separate final exam | Yes |
Literature
| keine |
Final exam
| Details |
As long as the number of participants is not too high, oral examination is preferred of written exams. Lowest competence level checked is knowledge. This could be e.g. structural components that are present in every microcsope, the raypath of a transmission and a reflexion microscope with Köhler illumination, the location of the angular apertur and the phase ring in a Zernike phase microscope or the reason for the direction selectivity in a differential interference contrast microscope. The next competence level is related to skills. Examination could be done by the calculation of required parameters of key components in a microscope, either on the basis of given application specifications or by the specification of some compontents, that are already in use. Furthermore it can be checked, if the setup of Köhler illumination can be explained, ideally with explanatory statements. The highest competence level adressed is methodical expertise. It can be checked by the discussion of a real world task: E.g.: Determine the radius of curvature of a lens. Here the choice of the right type of microscope is already important. Furthermore the process of data ackquisition and the data manipulation good methodical expertise. Another task could be to measure quantitatively the relative phase shift of two structures in an object. |
|---|---|
| Minimum standard | Correct answer of at least 50 % of the questions |
| Exam Type | EN mündliche Prüfung, strukturierte Befragung |
Learning goals
| Goal type | Description |
|---|---|
| Knowledge | depth of field paraxial, on the object side near and far point hyperfocal distance wace optical, on the image side amplitude- and phase objects law of Lamberr-Beer optical density phase, refraction index and optical distance Abbe's theory of image formation relative phase of diffraction orders of amplitude objects of phase objects phase microscope with phase disc location and size of zero'th diffraction order spatial coherence diffraction artefacts Zernike location and size of zero'th diffraction order spatial coherence the priniciple of Babinet diffraction artefacts visibility and contrast attenuation in the phase ring coherence visibility of interference temporal coherence lenght of wavetrains spectral composition of wavetrains time shifted arrival of amplitude split wavetrains fast change of interference patterns coherence time spatial coherence spatially split wavetrains phase shift in spatially split wavetrains in dependence of the location of the origin spatial overlay of interference patterns spatial coherence length interferometer Michelson compensation plate second interference pattern Mach-Zehnder phase shifts on reflexions complementary interference patterns contrast of unequal splitted wavefronts ambiguity of intereference patterns white light interferometer interference colors and contrast function interference microscope Linnik sorted pairs of objectives Michelson long work distance objectives Mirau Schwarzschild objectives differential interference contrast birefringence modification of Huygens' principle indicatrix Wollaston-, Nomarski- and Smith prisms splitting below resolution interference colors base optical path difference and lambda plate coherence requirements in the DIC temporal spatial transmission-interference microscopes Leitz' Mach-Zehnder interference microscope interphaco microscope |
| Skills | calculate depth of field convert optical density, dynamic in images and absorption coefficients into on another determine phase discontinuities at interfaces quatitatively calaculate sizes of phase rings and angular apertures of Zernike phase microscopes calculate the strength of diffraction orders and derive image contrast from them estimate temporal coherence from bandwith of frequencies and wavelengths and vice versa estimate spatial coeherence from lightsource size and distance and vice versa draw ray paths of the different interference micorscopes and explain them calculate the requirements regarding coherence in the different interference microscopes calculate geometries from ackquired interferograms predict colors in white light interferometry explain and compare physically and technically the underliying principles of different microscopes |
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Lecture | 2 |
| Tutorial (voluntary) | 0 |
Special requirements
| none |
| Accompanying material | lecture notes as downloadable file |
|---|---|
| Separate exam | No |
Learning goals
| Goal type | Description |
|---|---|
| Skills | set up Köhler illumination balancing lengths and angles in interferometers prepare objects for microscopy set up, adjust and use microscopes, especially bright field dark field reflexion transmission Zernike phase contrast Linnik interference contrast differential interference contrast choose a suitable microscopy principle for a given object and task tell artefacts from object details judge image quality write scientific report describe the task descirbe the idea of the solution explain the experimental setup explain the data processing make error analysis present the results and make a critical discussion |
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Practical training | 2 |
| Tutorial (voluntary) | 0 |
Special requirements
| none |
| Accompanying material |
Instrcutions for the experiments as downloadable files. Operating manuals for complex equipment as downloadable files. |
|---|---|
| Separate exam | Yes |
Separate exam
| Exam Type | EN Projektaufgabe im Team bearbeiten (z.B. im Praktikum) |
|---|---|
| Details | 1) Written examination questions related to the experiment have to be prepared at home and shown at the beginning of the laboratory. 2) The underlying ideas of the experiment have to be explained at the beginning of the laboratory. 3) Make the experiment alone (preferred) or in a team of two. - Build up and adjust your own setup - Acquire / measure date with this setup 4) Write a documentation on the experiment. It will be checked wih regard to - completness - scientific and precise language - correctness - understanding of the interrellations and interpretation of the results |
| Minimum standard | All written tasks must have been delt with. The basic ideas of the experiment must have been understood. All experiments must have been performed. The reports must be free of systematical errors. |
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