Course

KAT1 - Image Sensor Technology


PDF Course Catalog Deutsche Version: KAT1

Version: 3 | Last Change: 29.09.2019 13:46 | Draft: 0 | Status: vom verantwortlichen Dozent freigegeben

Long name Image Sensor Technology
Approving CModule KAT1_BaMT
Responsible
Prof. Dr.-Ing. Dirk Poggemann
Professor Fakultät IME
Level Bachelor
Semester in the year summer semester
Duration Semester
Hours in self-study 60
ECTS 5
Professors
Prof. Dr.-Ing. Dirk Poggemann
Professor Fakultät IME
Requirements Basic Knowledge in Electronics (Module "Electronics") and Optics and Sensors (Modules "Phototechnology 1", "Phototechnology 2" and "Phototechnology 3")
Language German, English if necessary
Separate final exam Yes
Literature
G. C. Holst, T. S. Lomheim, CMOS/CCD Sensors and Camera Systems, SPIE
G. R. Hopkinson, T. M. Goodman, S. R. Prince, A Guide to the Use and Calibration of Detector Array Equipment, SPIE
J.R.Janesick, Photon Transfer DN -> Lambda, SPIE
Final exam
Details
Written exam with arithmetic and comprehension excercises
Minimum standard
50% of maximum points
Exam Type
Written exam with arithmetic and comprehension excercises

Learning goals

Knowledge
Electronic Characteristics of Image Sensors
- Pixelfunction (Semiconductors / Photoelectric Effect, Photo-/Darkcurrent, Electrontransfer, Charge-/Voltage Conversion)
- CCD-Function (Chargetransfer, Binning, Multiple Output, CCD-Architectures)
- CMOS-Function (Read-Out, Exposurecontrol / Rolling Shutter, HDR-Sensors, Live-View)
- Comparison CCD-CMOS
- Modelling and Measurement of Electronic Characteristics (Linearization, Offset and Gain, Defectpixel, Determined Signalartifacts (FPN, DSNU, PRNU), Random Signalartifacts (real Noise), Influence of Temperature)
Optical Charateristics of Image Sensors
- Optical Stack (Antialiasing-Filter, Microlenses, IR-Filter, Color-Filter, Semiconductor-Topography)
- Modelling and Measurement of Optical Characteristics (Pixel-MTF, Vignetting, Spectral Sensitivity)
Image Correction
- Linearization/Gain- and Offset-Correction, Dark Image Subtraction (DSNU) Flatfielding (PRNU, Vignetting)
- Multiple-Output-Correction
Defectpixel- and Defectcluster-Correction
Expenditure classroom teaching
Type Attendance (h/Wk.)
Lecture 3
Tutorial (voluntary) 0
Special literature
keine/none
Special requirements
none
Accompanying material
electronic slides as presented during lectures
electronic collection of excercises
Separate exam
none

Learning goals

Skills
Measurement and Simulation of Characteristic Curve (Photodiode)
Measurement of Electronic Characteristics of Image Sensors
Measurement of Optical Characteristics of Image Sensors
Description and Documentation of Results
Expenditure classroom teaching
Type Attendance (h/Wk.)
Practical training 2
Tutorial (voluntary) 0
Special literature
keine/none
Special requirements
none
Accompanying material
electronic description of lab-excercises
Separate exam
Exam Type
working on practical scenarion (e.g. in a lab)
Details
short technical discussion during lab excercise
Reports about lab excercises
Minimum standard
Reports for all lab excercises must be delivered in correct form with correct results

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