Course Image Sensor Technology

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Responsible: Prof. Dr. Gregor Fischer

Course

Meets requirements of following modules(MID)

• in active programs
  • Ba MT2012 KAT1

Course Organization

Version created 2013-07-08 VID 1 valid from WS 2012/13 valid to

Course identifiers Long name Image Sensor Technology CID F07_KAT1 CEID (exam identifier)

Contact hours per week (SWS) Lecture 3 Exercise (unsplit) Exercise (split) Lab 2 Project Seminar Tutorial(voluntary)

Total contact hours Lecture 45 Exercise (unsplit) Exercise (split) Lab 30 Project Seminar Tutorial (voluntary)

Max. capacity Exercise (unsplit) Exercise (split) Lab 18 Project Seminar

Total effort (hours): 180

Instruction language

• German, English on demand

Study Level

• Undergraduate

Prerequisites

• none

Textbooks, Recommended Reading

• E.A. Weber, Foto Praktikum, Birkhäuser
• A. J. Theuwissen, Solid-State Imaging with Charge-Coupled Devices, Kluwer 1995
• G. R. Hopkinson, T. M. Goodman, S. R. Prince, A Guide to the Use and Calibration of Detector Array Equipment, SPIE 2004
• G. C. Holst, T. S. Lomheim, CMOS/CCD Sensors and Camera Systems, SPIE
• J. Nakamura, Image Sensors and Signal Processing for Digital Still Cameras, Taylor & Francis
• Reinhard/Ward/Pattanaik/Debevec, High Dynamic Range Imaging, Elsevier 2010

Instructors

• Prof. Dr. Gregor Fischer
• Prof. Dr. Dirk Poggemann

Supporting Scientific Staff

• tba

Transcipt Entry

Image Sensor Technology

Assessment

Type
wE	normal case (except on small numbers of assessments: oE)

Total effort [hours]
wE	10

Frequency: 1/year

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Course components

Lecture/Exercise

Objectives

Contents

• electical characteristics of sensor systems
  • pixel functions (semiconductors/ inner photoeffect, photo-/dark current, electron transfer and charge-/voltage-conversion)
  • CCD-functions (charge transfer, binning, multiple output, exposure control, ILT-CCD / FT-CCD / FF-CCD)
  • CMOS-functions (read out, exposure control/ rolling shutter, HDR-sensors, live-view)
  • system comparison CCD-CMOS
  • modeling and measurement of electrical sensor characteristics (linearity, offset and gain, defect pixels, spatial noise (FPN, DSNU, PRNU), temporal noise (real noise), influence of temperature)
• optical characteristics of sensor systems
  • optical setup (antialiasing-filter, microlenses, IR-filter, colorfilter, semiconductor topography)
  • modeling and measurement of optical sensor characteristics (pixel-MTF, vignetting, spectral sensitivity)
• sensor correction methods
  • linearisation/gain- and offset correction, dark frame subtraction (DSNU), flatfielding (PRNU, vignetting)
  • multiple output correction
  • defect pixel- and defect cluster correction
  • aperturecorrection (sharpening)

Acquired Skills

• understand and explain the electrical and optical functionalities and characteristics of different image sensor technologies
• derive and explain correction models from sensor characteristics

Additional Component Assessment

• none

Lab

Objectives

Acquired Skills

• detect and assess artefacts of sensor systems (moire, multiple output, hot pixel, defect pixel, ...)
• analyse and evaluate spatial and temporal noise
• specify dependencies of signal- and noise-components on exposure, exposure time and temperature according to their practical relevance

Operational Competences

• measure electronic sensor characteristics (dark current, noise, defect pixel)
• measure optical sensor characteristics
• perform qualitative comparison of different sensors
• present and document results

Additional Component Assessment

Type
fSC	supervised scenario study
fIN	interview on specific topics regarding to fSC

Contribution to course grade
fSC	Attestation
fIN	interview on specific topics regarding to fSC

Frequency: 1/year