Course
LMK - Light microscopy
PDF Course Catalog Deutsche Version: LMK
Version: 1 | Last Change: 19.09.2019 15:08 | Draft: 0 | Status: vom verantwortlichen Dozent freigegeben
| Long name | Light microscopy |
|---|---|
| Approving CModule | LMK_BaET, LMK_BaET |
| Responsible |
Prof. Dr. Stefan Altmeyer
Professor Fakultät IME |
| Level | Bachelor |
| Semester in the year | winter semester |
| Duration | Semester |
| Hours in self-study | 78 |
| ECTS | 5 |
| Professors |
Prof. Dr. Stefan Altmeyer
Professor Fakultät IME |
| Requirements | mathematics; vector calculus complex numbers physics / optics: geometrical optics wave optics |
| Language | German |
| Separate final exam | Yes |
Literature
keine
Final exam
Details
As long as the number of participants is not too high, oral examination is preferred of written exams.Lowest competence level checked is knowledge. This could be e.g. structural components that are present in every microcsope, the raypath of a transmission and a reflexion microscope with Köhler illumination, the location of the angular apertur and the phase ring in a Zernike phase microscope or the reason for the direction selectivity in a differential interference contrast microscope.
The next competence level is related to skills. Examination could be done by the calculation of required parameters of key components in a microscope, either on the basis of given application specifications or by the specification of some compontents, that are already in use. Furthermore it can be checked, if the setup of Köhler illumination can be explained, ideally with explanatory statements.
The highest competence level adressed is methodical expertise. It can be checked by the discussion of a real world task: E.g.: Determine the radius of curvature of a lens. Here the choice of the right type of microscope is already important. Furthermore the process of data ackquisition and the data manipulation good methodical expertise. Another task could be to measure quantitatively the relative phase shift of two structures in an object.
Minimum standard
Correct answer of at least 50 % of the questionsExam Type
As long as the number of participants is not too high, oral examination is preferred of written exams.Lowest competence level checked is knowledge. This could be e.g. structural components that are present in every microcsope, the raypath of a transmission and a reflexion microscope with Köhler illumination, the location of the angular apertur and the phase ring in a Zernike phase microscope or the reason for the direction selectivity in a differential interference contrast microscope.
The next competence level is related to skills. Examination could be done by the calculation of required parameters of key components in a microscope, either on the basis of given application specifications or by the specification of some compontents, that are already in use. Furthermore it can be checked, if the setup of Köhler illumination can be explained, ideally with explanatory statements.
The highest competence level adressed is methodical expertise. It can be checked by the discussion of a real world task: E.g.: Determine the radius of curvature of a lens. Here the choice of the right type of microscope is already important. Furthermore the process of data ackquisition and the data manipulation good methodical expertise. Another task could be to measure quantitatively the relative phase shift of two structures in an object.
Learning goals
Knowledge
depth of field
paraxial, on the object side
near and far point
hyperfocal distance
wace optical, on the image side
amplitude- and phase objects
law of Lamberr-Beer
optical density
phase, refraction index and optical distance
Abbe's theory of image formation
relative phase of diffraction orders
of amplitude objects
of phase objects
phase microscope
with phase disc
location and size of zero'th diffraction order
spatial coherence
diffraction artefacts
Zernike
location and size of zero'th diffraction order
spatial coherence
the priniciple of Babinet
diffraction artefacts
visibility and contrast
attenuation in the phase ring
coherence
visibility of interference
temporal coherence
lenght of wavetrains
spectral composition of wavetrains
time shifted arrival of amplitude split wavetrains
fast change of interference patterns
coherence time
spatial coherence
spatially split wavetrains
phase shift in spatially split wavetrains in dependence of the location of the origin
spatial overlay of interference patterns
spatial coherence length
interferometer
Michelson
compensation plate
second interference pattern
Mach-Zehnder
phase shifts on reflexions
complementary interference patterns
contrast of unequal splitted wavefronts
ambiguity of intereference patterns
white light interferometer
interference colors and contrast function
interference microscope
Linnik
sorted pairs of objectives
Michelson
long work distance objectives
Mirau
Schwarzschild objectives
differential interference contrast
birefringence
modification of Huygens' principle
indicatrix
Wollaston-, Nomarski- and Smith prisms
splitting below resolution
interference colors
base optical path difference and lambda plate
coherence requirements in the DIC
temporal
spatial
transmission-interference microscopes
Leitz' Mach-Zehnder interference microscope
interphaco microscope
paraxial, on the object side
near and far point
hyperfocal distance
wace optical, on the image side
amplitude- and phase objects
law of Lamberr-Beer
optical density
phase, refraction index and optical distance
Abbe's theory of image formation
relative phase of diffraction orders
of amplitude objects
of phase objects
phase microscope
with phase disc
location and size of zero'th diffraction order
spatial coherence
diffraction artefacts
Zernike
location and size of zero'th diffraction order
spatial coherence
the priniciple of Babinet
diffraction artefacts
visibility and contrast
attenuation in the phase ring
coherence
visibility of interference
temporal coherence
lenght of wavetrains
spectral composition of wavetrains
time shifted arrival of amplitude split wavetrains
fast change of interference patterns
coherence time
spatial coherence
spatially split wavetrains
phase shift in spatially split wavetrains in dependence of the location of the origin
spatial overlay of interference patterns
spatial coherence length
interferometer
Michelson
compensation plate
second interference pattern
Mach-Zehnder
phase shifts on reflexions
complementary interference patterns
contrast of unequal splitted wavefronts
ambiguity of intereference patterns
white light interferometer
interference colors and contrast function
interference microscope
Linnik
sorted pairs of objectives
Michelson
long work distance objectives
Mirau
Schwarzschild objectives
differential interference contrast
birefringence
modification of Huygens' principle
indicatrix
Wollaston-, Nomarski- and Smith prisms
splitting below resolution
interference colors
base optical path difference and lambda plate
coherence requirements in the DIC
temporal
spatial
transmission-interference microscopes
Leitz' Mach-Zehnder interference microscope
interphaco microscope
Skills
calculate depth of field
convert optical density, dynamic in images and absorption coefficients into on another
determine phase discontinuities at interfaces quatitatively
calaculate sizes of phase rings and angular apertures of Zernike phase microscopes
calculate the strength of diffraction orders and derive image contrast from them
estimate temporal coherence from bandwith of frequencies and wavelengths and vice versa
estimate spatial coeherence from lightsource size and distance and vice versa
draw ray paths of the different interference micorscopes and explain them
calculate the requirements regarding coherence in the different interference microscopes
calculate geometries from ackquired interferograms
predict colors in white light interferometry
explain and compare physically and technically the underliying principles of different microscopes
convert optical density, dynamic in images and absorption coefficients into on another
determine phase discontinuities at interfaces quatitatively
calaculate sizes of phase rings and angular apertures of Zernike phase microscopes
calculate the strength of diffraction orders and derive image contrast from them
estimate temporal coherence from bandwith of frequencies and wavelengths and vice versa
estimate spatial coeherence from lightsource size and distance and vice versa
draw ray paths of the different interference micorscopes and explain them
calculate the requirements regarding coherence in the different interference microscopes
calculate geometries from ackquired interferograms
predict colors in white light interferometry
explain and compare physically and technically the underliying principles of different microscopes
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Lecture | 2 |
| Tutorial (voluntary) | 0 |
Special literature
keine/none
Special requirements
none
Accompanying material
lecture notes as downloadable file
Separate exam
none
Learning goals
Skills
set up Köhler illumination
balancing lengths and angles in interferometers
prepare objects for microscopy
set up, adjust and use microscopes, especially
bright field
dark field
reflexion
transmission
Zernike phase contrast
Linnik interference contrast
differential interference contrast
choose a suitable microscopy principle for a given object and task
tell artefacts from object details
judge image quality
write scientific report
describe the task
descirbe the idea of the solution
explain the experimental setup
explain the data processing
make error analysis
present the results and make a critical discussion
balancing lengths and angles in interferometers
prepare objects for microscopy
set up, adjust and use microscopes, especially
bright field
dark field
reflexion
transmission
Zernike phase contrast
Linnik interference contrast
differential interference contrast
choose a suitable microscopy principle for a given object and task
tell artefacts from object details
judge image quality
write scientific report
describe the task
descirbe the idea of the solution
explain the experimental setup
explain the data processing
make error analysis
present the results and make a critical discussion
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Practical training | 2 |
| Tutorial (voluntary) | 0 |
Special literature
keine/none
Special requirements
none
Accompanying material
Instrcutions for the experiments as downloadable files.
Operating manuals for complex equipment as downloadable files.
Operating manuals for complex equipment as downloadable files.
Separate exam
Exam Type
working on projects assignment with your team e.g. in a lab)Details
1) Written examination questions related to the experiment have to be prepared at home and shown at the beginning of the laboratory.2) The underlying ideas of the experiment have to be explained at the beginning of the laboratory.
3) Make the experiment alone (preferred) or in a team of two.
- Build up and adjust your own setup
- Acquire / measure date with this setup
4) Write a documentation on the experiment. It will be checked wih regard to
- completness
- scientific and precise language
- correctness
- understanding of the interrellations and interpretation of the results
Minimum standard
All written tasks must have been delt with.The basic ideas of the experiment must have been understood.
All experiments must have been performed.
The reports must be free of systematical errors.
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