Course
KAT1 - Image Sensor Technology
PDF Course Catalog Deutsche Version: KAT1
Version: 3 | Last Change: 29.09.2019 13:46 | Draft: 0 | Status: vom verantwortlichen Dozent freigegeben
| Long name | Image Sensor Technology |
|---|---|
| Approving CModule | KAT1_BaMT |
| Responsible |
Prof. Dr.-Ing. Dirk Poggemann
Professor Fakultät IME |
| Level | Bachelor |
| Semester in the year | summer semester |
| Duration | Semester |
| Hours in self-study | 60 |
| ECTS | 5 |
| Professors |
Prof. Dr.-Ing. Dirk Poggemann
Professor Fakultät IME |
| Requirements | Basic Knowledge in Electronics (Module "Electronics") and Optics and Sensors (Modules "Phototechnology 1", "Phototechnology 2" and "Phototechnology 3") |
| Language | German, English if necessary |
| Separate final exam | Yes |
Literature
G. C. Holst, T. S. Lomheim, CMOS/CCD Sensors and Camera Systems, SPIE
G. R. Hopkinson, T. M. Goodman, S. R. Prince, A Guide to the Use and Calibration of Detector Array Equipment, SPIE
J.R.Janesick, Photon Transfer DN -> Lambda, SPIE
G. R. Hopkinson, T. M. Goodman, S. R. Prince, A Guide to the Use and Calibration of Detector Array Equipment, SPIE
J.R.Janesick, Photon Transfer DN -> Lambda, SPIE
Final exam
Details
Written exam with arithmetic and comprehension excercisesMinimum standard
50% of maximum pointsExam Type
Written exam with arithmetic and comprehension excercisesLearning goals
Knowledge
Electronic Characteristics of Image Sensors
- Pixelfunction (Semiconductors / Photoelectric Effect, Photo-/Darkcurrent, Electrontransfer, Charge-/Voltage Conversion)
- CCD-Function (Chargetransfer, Binning, Multiple Output, CCD-Architectures)
- CMOS-Function (Read-Out, Exposurecontrol / Rolling Shutter, HDR-Sensors, Live-View)
- Comparison CCD-CMOS
- Modelling and Measurement of Electronic Characteristics (Linearization, Offset and Gain, Defectpixel, Determined Signalartifacts (FPN, DSNU, PRNU), Random Signalartifacts (real Noise), Influence of Temperature)
Optical Charateristics of Image Sensors
- Optical Stack (Antialiasing-Filter, Microlenses, IR-Filter, Color-Filter, Semiconductor-Topography)
- Modelling and Measurement of Optical Characteristics (Pixel-MTF, Vignetting, Spectral Sensitivity)
Image Correction
- Linearization/Gain- and Offset-Correction, Dark Image Subtraction (DSNU) Flatfielding (PRNU, Vignetting)
- Multiple-Output-Correction
Defectpixel- and Defectcluster-Correction
- Pixelfunction (Semiconductors / Photoelectric Effect, Photo-/Darkcurrent, Electrontransfer, Charge-/Voltage Conversion)
- CCD-Function (Chargetransfer, Binning, Multiple Output, CCD-Architectures)
- CMOS-Function (Read-Out, Exposurecontrol / Rolling Shutter, HDR-Sensors, Live-View)
- Comparison CCD-CMOS
- Modelling and Measurement of Electronic Characteristics (Linearization, Offset and Gain, Defectpixel, Determined Signalartifacts (FPN, DSNU, PRNU), Random Signalartifacts (real Noise), Influence of Temperature)
Optical Charateristics of Image Sensors
- Optical Stack (Antialiasing-Filter, Microlenses, IR-Filter, Color-Filter, Semiconductor-Topography)
- Modelling and Measurement of Optical Characteristics (Pixel-MTF, Vignetting, Spectral Sensitivity)
Image Correction
- Linearization/Gain- and Offset-Correction, Dark Image Subtraction (DSNU) Flatfielding (PRNU, Vignetting)
- Multiple-Output-Correction
Defectpixel- and Defectcluster-Correction
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Lecture | 3 |
| Tutorial (voluntary) | 0 |
Special literature
keine/none
Special requirements
none
Accompanying material
electronic slides as presented during lectures
electronic collection of excercises
electronic collection of excercises
Separate exam
none
Learning goals
Skills
Measurement and Simulation of Characteristic Curve (Photodiode)
Measurement of Electronic Characteristics of Image Sensors
Measurement of Optical Characteristics of Image Sensors
Description and Documentation of Results
Measurement of Electronic Characteristics of Image Sensors
Measurement of Optical Characteristics of Image Sensors
Description and Documentation of Results
Expenditure classroom teaching
| Type | Attendance (h/Wk.) |
|---|---|
| Practical training | 2 |
| Tutorial (voluntary) | 0 |
Special literature
keine/none
Special requirements
none
Accompanying material
electronic description of lab-excercises
Separate exam
Exam Type
working on practical scenarion (e.g. in a lab)Details
short technical discussion during lab excerciseReports about lab excercises
Minimum standard
Reports for all lab excercises must be delivered in correct form with correct results
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